|
qp-fast
|
10
|
統(tǒng)一質(zhì)量SPM探針,三個(gè)矩形懸臂,軟/標(biāo)準(zhǔn)/快速/動(dòng)態(tài)AFM分別成像,
檢測(cè)面鍍金
|
|
20
|
|
50
|
|
qp-HBC
|
10
|
鍍層: 懸臂背面鍍鋁； 針尖形狀: 角錐形; 懸臂梁: 頻率 60 kHz 力常數(shù) 0.5 N/m 長(zhǎng)度 115 μm; 應(yīng)用范圍：智能探針
|
|
20
|
|
50
|
|
qp-BioT
|
10
|
qp-BioT探針有兩個(gè)三角懸臂梁，懸臂梁: 力常數(shù) 0.08 N/m 0.3 N/m; 應(yīng)用范圍：生物探針、液體探針；優(yōu)勢(shì)：力常數(shù)和共振頻率波動(dòng)范圍小，特別適用于的定量納米力學(xué)研究和生物測(cè)試
|
|
20
|
|
50
|
|
qp-BioAC
|
10
|
qp-BioAC探針三個(gè)懸臂梁，懸臂梁: 力常數(shù) 0.06 N/m 0.1 N/m 0.3 N/m; 應(yīng)用范圍：生物探針、液體探針；優(yōu)勢(shì)：力常數(shù)和共振頻率波動(dòng)范圍小，特別適用于的定量納米力學(xué)研究和生物測(cè)試
|
|
20
|
|
50
|
|
qp-BioAC-CI
|
10
|
qp-BioAC-CI探針三個(gè)懸臂梁，懸臂梁: 力常數(shù) 0.06 N/m 0.1 N/m 0.3 N/m; 應(yīng)用范圍：生物探針,細(xì)胞探針；優(yōu)勢(shì)：力常數(shù)和共振頻率波動(dòng)范圍小，特別適用于的定量納米力學(xué)研究和細(xì)胞測(cè)試
|
|
20
|
|
50
|
|
PtSi-NCH
|
10
|
新導(dǎo)電探針，鍍層: 鉑硅； 比常規(guī)導(dǎo)電探針更耐磨，電學(xué)信號(hào)更長(zhǎng)久，重復(fù)性好、分辨率高。應(yīng)用范圍：導(dǎo)電探針
|
|
20
|
|
50
|
|
ATEC-NC
|
10
|
輕敲探針，鍍層: 無(wú)； 針尖可視的探針，可應(yīng)用到對(duì)于那些針尖需要被精確定位或必須針尖可見(jiàn)的應(yīng)用（例如，用于納米操作）來(lái)說(shuō)，ATEC是必然的首選。由于其很小的半錐角尖端，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測(cè)量中表現(xiàn)出很好的性能。
|
|
20
|
|
50
|
|
ATEC-NCPt
|
10
|
導(dǎo)電探針，鍍層: 鉑銥； 針尖可視的探針，可應(yīng)用到對(duì)于那些針尖需要被精確定位或必須針尖可見(jiàn)的應(yīng)用（例如，用于納米操作）來(lái)說(shuō)，ATEC是必然的首選。由于其很小的半錐角尖端，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測(cè)量中表現(xiàn)出很好的性能。
|
|
20
|
|
50
|
|
PPP-NCH
|
10
|
輕敲探針，鍍層: 無(wú)； 其小于7納米的典型尖端半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。
|
|
20
|
|
50
|
|
PPP-NCH-W
|
380
|
|
PPP-NCHR
|
15
|
輕敲探針，鍍層: 懸臂背面鍍鋁； 其小于7納米的典型尖端半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。
|
|
20
|
|
50
|
|
PPP-NCHR-W
|
380
|
|
PPP-NCHPt
|
10
|
導(dǎo)電探針，鍍層: 鉑銥； 其小于25納米的典型尖端半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。
|
|
20
|
|
50
|
|
PPP-NCHPt-W
|
380
|
|
ATEC-NCAu
|
10
|
導(dǎo)電探針，鍍層: 金； 針尖可視的探針，可應(yīng)用到對(duì)于那些針尖需要被精確定位或必須針尖可見(jiàn)的應(yīng)用（例如，用于納米操作）來(lái)說(shuō)，ATEC是必然的首選。由于其很小的半錐角尖端，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測(cè)量中表現(xiàn)出很好的性能。
|
|
PPP-NCHAu
|
10
|
導(dǎo)電探針，鍍層: 金； 其小于25納米的典型尖端半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。
|
|
PPP-NCHAuD
|
10
|
導(dǎo)電探針，鍍層: 金； 其小于25納米的典型尖端半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。
|
|
PPP-XYNCHR
|
10
|
輕敲探針，鍍層: 懸臂背面鍍金； 此探針具有杰出的運(yùn)行穩(wěn)定性，優(yōu)異的靈敏度以及快速掃描能力。
|
|
20
|
|
50
|
|
PPP-QNCHR
|
10
|
輕敲探針，鍍層: 懸臂背面鍍鋁； 其小于7納米的典型尖端半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。
|
|
PPP-RT-NCHR
|
10
|
輕敲探針，鍍層: 懸臂背面鍍鋁； 其小于7納米的典型尖端半徑和很小的探針個(gè)體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。
|
|
20
|
|
50
|
|
PL2-NCH-10
|
10
|
輕敲探針，鍍層: 無(wú)；應(yīng)用:Plateau AFM Tips
|
|
PL2-NCHR-10
|
10
|
輕敲探針，鍍層: 懸臂背面鍍鋁；應(yīng)用:Plateau AFM Tips
|
|
TL-NCH
|
10
|
tipless探針，鍍層: 無(wú)；
|
|
20
|
|
50
|
|
SSS-NCH
|
10
|
尖探針，鍍層: 無(wú)； 針尖形狀: 懸臂梁: 頻率 330 kHz 力常數(shù) 42 N/m 長(zhǎng)度 125 μm; 應(yīng)用范圍：輕敲探針
|
|
20
|
|
50
|
|
SSS-NCHR
|
10
|
尖探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 懸臂梁: 頻率 330 kHz 力常數(shù) 42 N/m 長(zhǎng)度 125 μm; 應(yīng)用范圍：輕敲探針
|
|
20
|
|
50
|
|
AR5-NCH
|
10
|
HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1
|
|
20
|
|
50
|
|
AR5-NCH-W
|
370
|
|
AR5T-NCH
|
10
|
TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1,tilt compensation 13°
|
|
20
|
|
50
|
|
AR5T-NCH-W
|
365
|
|
AR10-NCH
|
10
|
HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1
|
|
20
|
|
50
|
|
AR10-NCH-W
|
370
|
|
AR10T-NCH
|
10
|
TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1, tilt compensation 13°
|
|
20
|
|
50
|
|
AR10T-NCH-W
|
365
|
|
AR5-NCHR
|
10
|
HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1, detector side :Al-coating
|
|
20
|
|
50
|
|
AR5-NCHR-W
|
370
|
|
AR5T-NCHR
|
10
|
TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1,tilt compensation 13°detector side: Al-coating
|
|
20
|
|
50
|
|
AR5T-NCHR-W
|
365
|
|
AR10-NCHR
|
10
|
HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1 detector side :Al-coating
|
|
20
|
|
50
|
|
AR10-NCHR-W
|
370
|
|
AR10T-NCHR
|
10
|
TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1, tilt compensation 13°detector side: Al-coating
|
|
20
|
|
50
|
|
AR10T-NCHR-W
|
365
|
|
DT-NCHR
|
10
|
DIAMOND COATED Probe, silicon cantilever for non-contact-/tapping-mode, detector side: Al-coating
|
|
20
|
|
50
|
|
CDT-NCHR
|
10
|
CONDUCTIVE DIAMOND COATED Probe, silicon cantilever for non-contact-/tapping-mode, detector side: Al-coating
|
|
20
|
|
50
|
|
PPP-NCST
|
10
|
輕敲探針，鍍層: 無(wú)，針尖形狀: 錐形; 懸臂梁: 頻率 160 kHz 力常數(shù) 7.4 N/m 長(zhǎng)度 150 μm; 應(yīng)用范圍：軟輕敲探針
|
|
20
|
|
50
|
|
PPP-NCST-W
|
380
|
|
PPP-NCSTR
|
10
|
輕敲探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 錐形; 懸臂梁: 頻率 160 kHz 力常數(shù) 7.4 N/m 長(zhǎng)度 150 μm; 應(yīng)用范圍：軟輕敲探針
|
|
20
|
|
50
|
|
PPP-NCSTR-W
|
380
|
|
PPP-NCSTPt
|
10
|
導(dǎo)電探針，鍍層: 鉑銥；
|
|
20
|
|
50
|
|
PPP-NCSTPt-w
|
380
|
|
PPP-NCSTAu
|
10
|
Silicon cantilever for non-contact-/tapping -mode,soft tapping, detector and tip side : Au-coating
|
|
PPP-NCSTAuD
|
10
|
Silicon cantilever for non-contact-/tapping -mode,soft tapping, detector and tip side : Au-coating
|
|
PPP-XYNCSTR
|
10
|
Silicon cantilever for non-contact-/tapping -mode,soft tapping, detector and tip side : Al-coating,XY-auto aligment
|
|
20
|
|
50
|
|
PPP-NCL
|
10
|
Silicon cantilever for non-contact -/tapping -mode, long cantilever
|
|
20
|
|
50
|
|
PPP-NCL-W
|
380
|
|
PPP-NCLR
|
10
|
Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector side : Al-coating
|
|
20
|
|
50
|
|
PPP-NCLR-W
|
380
|
|
PPP-NCLPt
|
10
|
Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector side :
Pt/Ir-coating, tip side : Pt/Ir-coating
|
|
20
|
|
50
|
|
PPP-NCLPt-W
|
380
|
|
PPP-NCLAu
|
10
|
Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector and tip side : Au-coating
|
|
PPP-NCLAuD
|
10
|
Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector side : Au-coating
|
|
PL2-NCL
|
10
|
Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact-/tapping
-mode,long cantilever
|
|
PL2-NCLR
|
10
|
Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact-/tapping
-mode,long cantilever, detector side: Al-coating
|
|
TL-NCL
|
10
|
Tipless silicon cantilever based on POINTPROBE technology
|
|
20
|
|
50
|
|
SSS-NCL
|
10
|
尖探針，鍍層: 無(wú)； 針尖形狀: 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長(zhǎng)度 225 μm; 應(yīng)用范圍：輕敲探針
|
|
20
|
|
50
|
|
SSS-NCLR
|
10
|
尖探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長(zhǎng)度 225 μm; 應(yīng)用范圍：輕敲探針
|
|
20
|
|
50
|
|
AR5-NCL
|
10
|
高長(zhǎng)徑比探針，鍍層: 無(wú)； 針尖形狀: 高長(zhǎng)徑比; 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長(zhǎng)度 225 μm; 應(yīng)用范圍：高長(zhǎng)徑比探針
|
|
20
|
|
50
|
|
AR5-NCL-W
|
370
|
|
AR5-NCLR
|
10
|
高長(zhǎng)徑比探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 高長(zhǎng)徑比; 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長(zhǎng)度 225 μm; 應(yīng)用范圍：高長(zhǎng)徑比探針
|
|
20
|
|
50
|
|
AR5-NCLR-W
|
370
|
|
DT-NCLR
|
10
|
金剛石探針，高長(zhǎng)徑比探針，硅懸臂非接觸式- /敲擊模式，鍍層: 懸臂背面鍍鋁
|
|
20
|
|
50
|
|
CDT-NCLR
|
10
|
導(dǎo)電金剛石探針，高長(zhǎng)徑比探針，硅懸臂非接觸式- /敲擊模式，鍍層: 懸臂背面鍍鋁
|
|
20
|
|
50
|
|
A-Probe
|
10
|
AKiyama-Probe, self-sensing and self-actuating(-exciting) probe for dynamic mode AFM
|
|
PPP-SEIH
|
10
|
Silicon cantilever for non-contact/tapping
-mode,special type A.
|
|
20
|
|
50
|
|
PPP-SEIH-W
|
380
|
|
PPP-SEIHR
|
10
|
Silicon cantilever for non-contact/tapping
-mode,special type A, detector side : Al-coating
|
|
20
|
|
50
|
|
PPP-SEIHR-W
|
380
|
